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Direct spatiochemical imaging of the specific domains and defect structures in self-assembled BCP patterns will provide valuable information about the materials, process, and pattern quality ( 2). For example, supramolecular self-assembly of block copolymer (BCP) films is a promising method to extend nanofabrication beyond the limits of optical lithography, readily producing periodic structures with periods of 10 to 100 nm ( 1) to advance this class of materials, there is a pressing need for an analytical technique with a high degree of chemical specificity and spatial resolution. With chemical-specific nanometer-scale imaging, PiFM provides a powerful new analytical method for deepening our understanding of nanomaterials.Īmbient nondestructive topographic and chemical measurements of nanoscale materials and supramolecular structures are essential in research, development, and manufacturing in a variety of fields, including microelectronics, composite materials, nanotechnology, and life sciences. By imaging at multiple IR wavelengths corresponding to absorption peaks of different chemical species, PiFM has demonstrated the ability to spatially map nm-scale patterns of the individual chemical components of two different types of self-assembled block copolymer films. A novel scanning probe technique called infrared photoinduced force microscopy (IR PiFM) directly measures the photoinduced polarizability of the sample in the near field by detecting the time-integrated force between the tip and the sample. For example, supramolecular self-assembly, which provides a powerful and low-cost way to create nanoscale patterns and engineered nanostructures, is not easily interrogated in real space via existing nondestructive techniques based on optics or electrons.

Correlating spatial chemical information with the morphology of closely packed nanostructures remains a challenge for the scientific community.

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